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The effect of ion-beam specimen preparation techniques on vacancy-type defects in silicon

Gandy, A.S., Donnelly, S. E., Beaufort, M.-F., Vishnyakov, Vladimir and Barbot, J.-F. (2006) The effect of ion-beam specimen preparation techniques on vacancy-type defects in silicon. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 242 (1-2). pp. 610-613. ISSN 0168-583X

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Abstract

Ion bombardment is frequently used in the preparation of thin foils of a variety of materials for analysis by transmission electron microscopy (TEM) and related techniques. We have studied in detail the effects of such specimen preparation techniques on nanometre-sized cavities in silicon by comparing ion-beam milled cross-sectional specimens with those prepared using a small-angle cleavage technique. The cavities have been formed by a prior implantation of energetic helium ions and a high-temperature anneal. In the specimens prepared by ion-beam techniques in two different commercial systems, there is a clear effect on the small cavities. Specifically, the cavities are observed to migrate away from the original surface at both room temperature and liquid nitrogen temperature. The effect is discussed in the context of the interaction of the cavities with mobile vacancies and interstitials injected by the ion bombardment. We believe this to be an important effect that must be taken into account when using TEM techniques to study defects in semiconductors.

Item Type: Article
Subjects: Q Science > QC Physics
Schools: School of Computing and Engineering > Electron Microscopy and Materials Analysis
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Depositing User: Graeme Greaves
Date Deposited: 02 Oct 2013 08:34
Last Modified: 09 Oct 2014 10:35
URI: http://eprints.hud.ac.uk/id/eprint/18691

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