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Low energy ion scattering as a probe of neon radiation damage in nickel

Donnelly, S. E., Elliman, R.G., O'Connor, D.J. and MacDonald, R.J. (1986) Low energy ion scattering as a probe of neon radiation damage in nickel. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 15 (1-6). pp. 130-133. ISSN 0168-583X

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Abstract

The channelling of low energy (keV) hydrogen ions in double alignment geometry has been used to probe damage induced in a (110) nickel specimen by low energy neon irradiation. The channelling spectra, which exhibit a clear surface peak. yield information on both surface and near-surface radiation damage. We present results on sub-surface damage build up, as a function of fluence at different neon energies, which clearly indicate sensitivity to damage level and depth. Asymmetries observed in ion yields along crystallographically equivalent direction are discussed in terms of possible damage configurations.

Item Type: Article
Subjects: Q Science > QC Physics
Schools: School of Computing and Engineering > Electron Microscopy and Materials Analysis
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Depositing User: Graeme Greaves
Date Deposited: 02 Oct 2013 07:55
Last Modified: 02 Oct 2013 07:55
URI: http://eprints.hud.ac.uk/id/eprint/18677

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