Suder, Suli, Faunce, C.A. and Donnelly, S. E. (1997) Thin solid film sample preparation by a small-angle cleavage for transmission electron microscopy. Thin Solid Films, 304 (1-2). pp. 157-159. ISSN 0040-6090Metadata only available from this repository.
Thin solid film samples have been prepared by a small-angle cleavage technique using hand tools. Cleaved wedges from the same material are mounted both as plan-view and cross-sectional samples on the same transmission electron microscopy (TEM) specimen grid allowing convenient examination in both views. The samples of Si3N4, Zr and Co films deposited on Si prepared by this technique are shown to be suitable for analysis in TEM.
|Subjects:||Q Science > QC Physics|
|Schools:||School of Computing and Engineering > Electron Microscopy and Materials Analysis|
|Depositing User:||Graeme Greaves|
|Date Deposited:||02 Oct 2013 10:28|
|Last Modified:||02 Oct 2013 10:28|
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