Search:
Computing and Library Services - delivering an inspiring information environment

Thin solid film sample preparation by a small-angle cleavage for transmission electron microscopy

Suder, Suli, Faunce, C.A. and Donnelly, S. E. (1997) Thin solid film sample preparation by a small-angle cleavage for transmission electron microscopy. Thin Solid Films, 304 (1-2). pp. 157-159. ISSN 0040-6090

Metadata only available from this repository.

Abstract

Thin solid film samples have been prepared by a small-angle cleavage technique using hand tools. Cleaved wedges from the same material are mounted both as plan-view and cross-sectional samples on the same transmission electron microscopy (TEM) specimen grid allowing convenient examination in both views. The samples of Si3N4, Zr and Co films deposited on Si prepared by this technique are shown to be suitable for analysis in TEM.

Item Type: Article
Subjects: Q Science > QC Physics
Schools: School of Computing and Engineering > Electron Microscopy and Materials Analysis
Related URLs:
Depositing User: Graeme Greaves
Date Deposited: 02 Oct 2013 10:28
Last Modified: 02 Oct 2013 10:28
URI: http://eprints.hud.ac.uk/id/eprint/18649

Downloads

Downloads per month over past year

Repository Staff Only: item control page

View Item View Item

University of Huddersfield, Queensgate, Huddersfield, HD1 3DH Copyright and Disclaimer All rights reserved ©