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Dispersed reference interferometry

Martin, Haydn and Jiang, Xiangqian (2013) Dispersed reference interferometry. CIRP Annals - Manufacturing Technology, 62 (1). pp. 551-554. ISSN 0007-8506

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Abstract

Dispersed reference interferometry (DRI) is a potentially useful technique for applications such as absolute displacement, surface topography
and film thickness measurement. A bulk optic implementation of a short coherence dispersed reference interferometer is described with the
chromatic dispersion applied using two matched transmission gratings in one arm. Such an interferometer can provide absolute knowledge of
position by tracking a symmetrical fringe pattern produced by a spectrometer. An operating principle is presented and validation provided
through empirical data from optical apparatus. We present experimental results for the resolution, linearity and repeatability of the
investigated interferometer apparatus.

Item Type: Article
Subjects: T Technology > TJ Mechanical engineering and machinery
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Schools: School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > EPSRC Centre for Innovative Manufacturing in Advanced Metrology
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
School of Computing and Engineering
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Depositing User: Haydn Martin
Date Deposited: 25 Sep 2013 10:43
Last Modified: 01 Dec 2016 14:54
URI: http://eprints.hud.ac.uk/id/eprint/18513

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