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Novel spatial scanning technique for surface roughness measurement

Xie, F., Zhang, W., Jiang, Xiang, Zhang, L. and Bennion, Ian (2003) Novel spatial scanning technique for surface roughness measurement. Lasers and Electro-Optics Society, IEEELEOS, 1 (27-28). pp. 97-98.

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Abstract

We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique

Item Type: Article
Subjects: T Technology > T Technology (General)
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Briony Heyhoe
Date Deposited: 29 Aug 2008 15:34
Last Modified: 02 Dec 2010 13:18
URI: http://eprints.hud.ac.uk/id/eprint/1699

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