Novel spatial scanning technique for surface roughness measurement

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Xie, F., Zhang, W., Jiang, Xiang, Zhang, L. and Bennion, Ian (2003) Novel spatial scanning technique for surface roughness measurement. Lasers and Electro-Optics Society, IEEELEOS, 1 (27-28). pp. 97-98.

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Official URL: http://dx.doi.org/10.1109/LEOS.2003.1251618

DOI: 10.1109/LEOS.2003.1251618

Abstract

We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique

Item Type:	Article
Subjects:	T Technology > T Technology (General) T Technology > TK Electrical engineering. Electronics Nuclear engineering
Schools:	School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Related URLs:	Author
Depositing User:	Briony Heyhoe
Date Deposited:	29 Aug 2008 15:34
Last Modified:	02 Dec 2010 13:18
URI:	http://eprints.hud.ac.uk/id/eprint/1699

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