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Pulsed eddy current system for dynamic inspection of defects

Tian, G.Y., Sophian, Ali, Taylor, D. and Rudlin, J. (2004) Pulsed eddy current system for dynamic inspection of defects. Insight, 46 (5). pp. 256-259. ISSN 1354-2575

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Abstract

Pulsed Eddy Current (PEC) techniques have been investigated and applied for field applications. On-line inspection is essential for many manufacturing processes and other NDE applications. This paper investigates the dynamic behaviour of pulsed eddy current techniques and the feasibility of their use in an on-line inspection system. After discussing the PEC principles and their signal signatures, an approach on improving the dynamic response of PEC is introduced and tested. The results have illustrated that the proposed PEC system and their feature extraction can be used for real-time inspection such as NDT for manufacturing processes

Item Type: Article
Subjects: T Technology > T Technology (General)
T Technology > TS Manufactures
Schools: School of Computing and Engineering
School of Computing and Engineering > Computer Graphics, Imaging and Vision Research Group
Depositing User: Briony Heyhoe
Date Deposited: 29 Aug 2008 10:48
Last Modified: 06 Jan 2011 09:23
URI: http://eprints.hud.ac.uk/id/eprint/1672

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