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Automatic processing of interferogram from surface roughness measuring interferometer

Chen, Xiaomei and Long, Zuhong (1993) Automatic processing of interferogram from surface roughness measuring interferometer. Acta Optica Sinica, 13 (11). pp. 1040-1044. ISSN 0253-2239

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Abstract

Computer-based processing of interferogram of surface roughness measuring intererometer is introduced in the paper, in which threshold segmenting of brightness are used for binary image processing and border following for edge curve sampling.

Item Type: Article
Contributors:
ContributionNameEmailORCID
AuthorChen, Xiaomeix.chen2@hud.ac.ukUNSPECIFIED
AuthorLong, ZuhongUNSPECIFIEDUNSPECIFIED
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
T Technology > TS Manufactures
Schools: School of Computing and Engineering
Related URLs:
Depositing User: Xiaomei Chen
Date Deposited: 05 Feb 2013 15:19
Last Modified: 04 Nov 2015 16:45
URI: http://eprints.hud.ac.uk/id/eprint/16513

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