Lou, Shan, Jiang, Xiangqian and Scott, Paul J. (2012) An Efficient Divide-and-Conquer Algorithm for Morphological Filters. Procedia Engineering: 12th CIRP Conference on Computer Aided Tolerancing. ISSN 1877-7058 (In Press)
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Morphological filters, evolved from the traditional envelope filter, are function oriented filtration techniques. A recent research on the implementation of morphological filters was based on the theoretical link between morphological operations and the alpha shape. However the Delaunay triangulation on which the alpha shape method depends is costly for large areal data. This paper proposes a divide-and-conquer method as an optimization to the alpha shape method aiming to speed up its performance. The large areal surface is divided into small sub-surfaces so that the alpha shape method is executed on the partitioned surfaces in a fast manner. The contact points are searched on each sub-surface and merged into a super set on which the alpha shape method is applied again to archive the updated result. The recursion process is repeated until the contact points of the whole surface are obtained. The morphological envelope could be computed recursively without the 3D Delaunay triangulation to the whole surface data. Meanwhile this method retains almost all the merits of the alpha shape method. The experiment shows that the result obtained by the divide-and-conquer algorithm is consistent with the one generated by applying the alpha shape method directly. The performance evaluation reveals that the divide-and-conquer algorithm achieved superior performances over the original alpha shape method.▼ Jump to Download Statistics
|Uncontrolled Keywords:||morphological filter; surface texture; divide-and-conquer; alpha shape|
|Subjects:||T Technology > TJ Mechanical engineering and machinery|
|Schools:||School of Computing and Engineering|
School of Computing and Engineering > Centre for Precision Technologies > EPSRC Centre for Innovative Manufacturing in Advanced Metrology
 Von Weingraber H. Über die Eignung des Hüllprofils als Bezugslinie für die Messung der Rauheit.
|Depositing User:||Shan Lou|
|Date Deposited:||04 Dec 2012 15:57|
|Last Modified:||04 Dec 2012 16:27|
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