Search:
Computing and Library Services - delivering an inspiring information environment

An in-situ TEM study of the effects of 6 keV He ion irradiation on Si and SiO2

Donnelly, S. E., Hinks, J. A., Pawley, C J, Abrams, K J and Van den Berg, Jakob (2012) An in-situ TEM study of the effects of 6 keV He ion irradiation on Si and SiO2. Journal of Physics: Conference Series, 371. 012045. ISSN 1742-6596

Metadata only available from this repository.
Item Type: Article
Subjects: Q Science > Q Science (General)
Q Science > QC Physics
Schools: School of Computing and Engineering
School of Computing and Engineering > Electron Microscopy and Materials Analysis
Related URLs:
Depositing User: Jonathan Hinks
Date Deposited: 27 Nov 2012 16:07
Last Modified: 02 Sep 2013 11:25
URI: http://eprints.hud.ac.uk/id/eprint/16008

Item control for Repository Staff only:

View Item

University of Huddersfield, Queensgate, Huddersfield, HD1 3DH Copyright and Disclaimer All rights reserved ©