Donnelly, S. E., Hinks, J. A., Pawley, C J, Abrams, K J and Van den Berg, Jakob (2012) An in-situ TEM study of the effects of 6 keV He ion irradiation on Si and SiO2. Journal of Physics: Conference Series, 371. 012045. ISSN 1742-6596
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An in-situ TEM study of the effects of 6 keV He ion irradiation on Si and SiO2.pdf - Accepted Version

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