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Composition and structure of enriched alloy layers in filmed Al alloys studied by medium-energy ion scattering

Bailey, Paul, Skeldon, P., Noakes, T. C. Q., Thompson, G. E., Sakairi, M., Habazaki, H. and Shimizu, K. (2001) Composition and structure of enriched alloy layers in filmed Al alloys studied by medium-energy ion scattering. Surface and Interface Analysis, 31 (6). pp. 480-483. ISSN 0142-2421

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Abstract

The topmost 20 nm of an electropolished Al–1 at.% Cu alloy has been investigated at sub-nanometre resolution using medium-energy ion scattering. Differences in the composition and depth of the enriched Cu layer are observed. Most significantly, the enriched layer contains regions of differing structure and/or lattice orientation with Cu atoms located in distinct ordered regions, consistent with the presence of Cu-rich clusters. Surface-segregated Si and Cu are observed and Cl and Cu are found in the oxide

Item Type: Article
Subjects: Q Science > Q Science (General)
Q Science > QC Physics
Schools: School of Applied Sciences
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Depositing User: Sharon Beastall
Date Deposited: 11 Sep 2012 10:05
Last Modified: 11 Sep 2012 10:05
URI: http://eprints.hud.ac.uk/id/eprint/14785

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