Zeng, Wenhan, Jiang, Xiangqian and Scott, Paul J. (2012) A new method to characterize the structured tessellation surface. Procedia Engineering: 12th CIRP Conference on Computer Aided Tolerancing. ISSN 1877-7058 (In Press)
|PDF - Accepted Version |
Restricted to Repository staff only
Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.
|Subjects:||T Technology > TJ Mechanical engineering and machinery|
|Schools:||School of Computing and Engineering|
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
|Depositing User:||Wenhan Zeng|
|Date Deposited:||06 Sep 2012 16:05|
|Last Modified:||06 Sep 2012 16:11|
Downloader CountriesMore statistics for this item...
Item control for Repository Staff only: