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A new method to characterize the structured tessellation surface

Zeng, Wenhan, Jiang, Xiangqian and Scott, Paul J. (2012) A new method to characterize the structured tessellation surface. Procedia Engineering: 12th CIRP Conference on Computer Aided Tolerancing. ISSN 1877-7058 (In Press)

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    Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.

    Item Type: Article
    Subjects: T Technology > TJ Mechanical engineering and machinery
    Schools: School of Computing and Engineering
    School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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    Depositing User: Wenhan Zeng
    Date Deposited: 06 Sep 2012 16:05
    Last Modified: 06 Sep 2012 16:11


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