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Zeng, Wenhan, Jiang, Xiangqian and Scott, Paul J. (2012) A new method to characterize the structured tessellation surface. Procedia Engineering: 12th CIRP Conference on Computer Aided Tolerancing. ISSN 1877-7058 (In Press)
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Abstract
Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.
| Item Type: | Article |
|---|---|
| Subjects: | T Technology > TJ Mechanical engineering and machinery |
| Schools: | School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
| Related URLs: | |
| Depositing User: | Wenhan Zeng |
| Date Deposited: | 06 Sep 2012 16:05 |
| Last Modified: | 06 Sep 2012 16:11 |
| URI: | http://eprints.hud.ac.uk/id/eprint/14583 |
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