Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2003) Advances in micro and nano-scale surface metrology. In: ISMTII 2003, The Sixth International Symposium on Measurement Technology and Intelligent Instruments, 28 November - 1 December 2003, Academic Building, Hong Kong University of Science and Technology, Kowloon, Hong Kong.
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