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Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2003) Advances in micro and nano-scale surface metrology. In: ISMTII 2003, The Sixth International Symposium on Measurement Technology and Intelligent Instruments, 28 November - 1 December 2003, Academic Building, Hong Kong University of Science and Technology, Kowloon, Hong Kong.
Metadata only available from this repository.| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | T Technology > T Technology (General) T Technology > TA Engineering (General). Civil engineering (General) |
| Schools: | School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
| Related URLs: | |
| Depositing User: | Briony Heyhoe |
| Date Deposited: | 12 Aug 2008 16:06 |
| Last Modified: | 26 Nov 2010 12:08 |
| URI: | http://eprints.hud.ac.uk/id/eprint/1457 |
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