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Advances in micro and nano-scale surface metrology

Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2003) Advances in micro and nano-scale surface metrology. In: ISMTII 2003, The Sixth International Symposium on Measurement Technology and Intelligent Instruments, 28 November - 1 December 2003, Academic Building, Hong Kong University of Science and Technology, Kowloon, Hong Kong.

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Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > T Technology (General)
T Technology > TA Engineering (General). Civil engineering (General)
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Briony Heyhoe
Date Deposited: 12 Aug 2008 16:06
Last Modified: 26 Nov 2010 12:08
URI: http://eprints.hud.ac.uk/id/eprint/1457

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