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Zeng, Wenhan, Jiang, Xiang, Scott, Paul J. and Blunt, Liam (2005) Metrological characteristics of complex wavelet transform for surface topography analysis. In: 5th euspen International Conference, 9th-12th May 2005, Montpellier, France. (Unpublished)
Metadata only available from this repository.| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | T Technology > T Technology (General) Q Science > QC Physics |
| Schools: | School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
| Related URLs: | |
| Depositing User: | Briony Heyhoe |
| Date Deposited: | 08 Aug 2008 16:30 |
| Last Modified: | 02 Dec 2010 13:54 |
| URI: | http://eprints.hud.ac.uk/id/eprint/1442 |
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