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Metrological characteristics of complex wavelet transform for surface topography analysis

Zeng, Wenhan, Jiang, Xiang, Scott, Paul J. and Blunt, Liam (2005) Metrological characteristics of complex wavelet transform for surface topography analysis. In: 5th euspen International Conference, 9th-12th May 2005, Montpellier, France. (Unpublished)

Metadata only available from this repository.
Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > T Technology (General)
Q Science > QC Physics
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Briony Heyhoe
Date Deposited: 08 Aug 2008 16:30
Last Modified: 02 Dec 2010 13:54
URI: http://eprints.hud.ac.uk/id/eprint/1442

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