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Integrated Tactile and Optical Measuring Systems in Three Dimensional Metrology

Li, Feng, Longstaff, Andrew P., Fletcher, Simon and Myers, Alan (2012) Integrated Tactile and Optical Measuring Systems in Three Dimensional Metrology. In: Proceedings of The Queen’s Diamond Jubilee Computing and Engineering Annual Researchers’ Conference 2012: CEARC’12. University of Huddersfield, Huddersfield, pp. 1-6. ISBN 978-1-86218-106-9

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      Coordinate measuring machine (CMM) technology is widely used in inspection, but sometimes it is not suitable for measuring complex parts in dimensional metrology or reverse engineering owing its inherent slow speed. On the other hand, optical scanning sensors acquire data rapidly, but have poorer accuracy and access restrictions. Multi-sensor systems allow selection of discrete probing or scanning methods to measure part elements. The decision is often based on the principle that tight tolerance elements should be measured by contact methods, while other more loose tolerance elements can be scanned by optical sensors. This article summarizes recent developments and applications of hybrid tactile and non-contact 3D measuring systems and gives examples of its applications in dimensional metrology. Recent and future developments will concentrate on improved measuring reliability, reduced uncertainty of measurement data and higher accuracy and lower costs.

      Item Type: Book Chapter
      Uncontrolled Keywords: Dimensional metrology, CMM, Sensor, Hybrid systems
      Subjects: T Technology > TA Engineering (General). Civil engineering (General)
      Schools: School of Computing and Engineering
      School of Computing and Engineering > Centre for Precision Technologies > Engineering Control and Machine Performance Research Group
      School of Computing and Engineering > Computing and Engineering Annual Researchers' Conference (CEARC)
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      Depositing User: Graham Stone
      Date Deposited: 26 Apr 2012 09:55
      Last Modified: 26 Apr 2012 13:29


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