Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction

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Petrik, Peter, Milita, Silvia, Pucker, Georg, Nassiopoulou, Androula G., Van den Berg, Jakob, Reading, Michael A., Fried, Miklos, Lohner, Tivadar, Theodoropoulou, M, Gardelis, Spyros, Barozzi, Mario, Ghulinyan, Mher, Lui, Alberto, Vanzetti, Lia and Picciotto, Antonio (2009) Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction. ECS Transactions, 25 (3). pp. 373-378. ISSN 1938-5862

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Official URL: http://dx.doi.org/10.1149/1.3204427

DOI: 10.1149/1.3204427

Abstract

Nanocrystalline semiconductors embedded in dielectric matrices are currently under investigation for use in Si-photonics and in memory devices. The aim of a joint research activity in the FP6-ANNA*) project (http://www.i3-anna.org) is to develop and improve metrologies for the measurement of nanocrystal properties.

Item Type:	Article
Subjects:	Q Science > QC Physics
Schools:	School of Applied Sciences
Related URLs:	Author
Depositing User:	Sharon Beastall
Date Deposited:	03 Jan 2012 10:53
Last Modified:	22 May 2012 15:35
URI:	http://eprints.hud.ac.uk/id/eprint/12255

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