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Approximation of surface roughness profiles and parameters

Brennan, James K., Crampton, Andrew, Jiang, Xiang, Leach, Richard K. and Harris, Peter M. (2005) Approximation of surface roughness profiles and parameters. In: International Conference on Advanced Mathematical and Computational Tools in Metrology (AMCTM 2005), 27–29 June, 2005, Instituto Português da Qualidade, Caparica, Portugal. (Unpublished)

Metadata only available from this repository.
Item Type: Conference or Workshop Item (Poster)
Subjects: T Technology > T Technology (General)
T Technology > TA Engineering (General). Civil engineering (General)
Schools: School of Computing and Engineering
School of Computing and Engineering > Automotive Engineering Research Group
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
School of Computing and Engineering > High-Performance Intelligent Computing
School of Computing and Engineering > High-Performance Intelligent Computing > Planning, Autonomy and Representation of Knowledge
School of Computing and Engineering > High-Performance Intelligent Computing > Planning, Autonomy and Representation of Knowledge

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School of Computing and Engineering > High-Performance Intelligent Computing > Information and Systems Engineering Group
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Depositing User: Briony Heyhoe
Date Deposited: 21 Jul 2008 14:49
Last Modified: 10 Dec 2010 13:27
URI: http://eprints.hud.ac.uk/id/eprint/1147

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