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Advances in micro and nano-scale surface metrology

Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2005) Advances in micro and nano-scale surface metrology. Key Engineering Materials, 295-296. pp. 431-436. ISSN 1013-9826

Metadata only available from this repository.
Item Type: Article
Subjects: T Technology > T Technology (General)
T Technology > TA Engineering (General). Civil engineering (General)
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Briony Heyhoe
Date Deposited: 21 Jul 2008 12:00
Last Modified: 26 Nov 2010 11:50
URI: http://eprints.hud.ac.uk/id/eprint/1137

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