Advances in micro and nano-scale surface metrology

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Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2005) Advances in micro and nano-scale surface metrology. Key Engineering Materials, 295-296. pp. 431-436. ISSN 1013-9826

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Official URL: http://www.scientific.net/0-87849-977-6/431/

Item Type:	Article
Subjects:	T Technology > T Technology (General) T Technology > TA Engineering (General). Civil engineering (General)
Schools:	School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Related URLs:	Author Author Author
Depositing User:	Briony Heyhoe
Date Deposited:	21 Jul 2008 12:00
Last Modified:	26 Nov 2010 11:50
URI:	http://eprints.hud.ac.uk/id/eprint/1137

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