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Geometrical characterisation of MST and microfluidic devices using novel surface metrology techniques

Blunt, Liam, Xiao, Shaojun, Jiang, Xiang and Scott, Paul J. (2005) Geometrical characterisation of MST and microfluidic devices using novel surface metrology techniques. In: 5th euspen International Conference, 9th-12th May 2005, Montpellier, France. (Unpublished)

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Item Type: Conference or Workshop Item (Poster)
Subjects: T Technology > T Technology (General)
T Technology > TA Engineering (General). Civil engineering (General)
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Briony Heyhoe
Date Deposited: 21 Jul 2008 11:11
Last Modified: 26 Nov 2010 11:54
URI: http://eprints.hud.ac.uk/id/eprint/1134

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